Title :
Damage of carbon nanotube films during field emission
Author :
Liang, X.H. ; Xu, N.S. ; Chen, Jun ; Deng, S.Z.
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
Abstract :
The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.
Keywords :
carbon nanotubes; current density; field emission; thin films; C; carbon nanotube films; critical emission current density; damage effects; emission current level; field emission; Anodes; Carbon nanotubes; Current density; Degradation; Laboratories; Morphology; Organic materials; Scanning electron microscopy; Transmission electron microscopy; Voltage;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN :
0-7803-8397-4
DOI :
10.1109/IVNC.2005.1619618
