• DocumentCode
    1670055
  • Title

    Influence of the dielectric layer on the performance of FED

  • Author

    Gu, Wei ; Lei, Wei ; Zhang, Xiaobing

  • Author_Institution
    Dept. of Electron. Eng., Southeast Univ., Nanjing, China
  • fYear
    2005
  • Abstract
    In a field emission display device, the triode structure influences the emission characteristic of the field emitters seriously. And the focusing of the electron beam is hard to achieve. Apart from this, the permittivity of the dielectric layer (εd) in the triode determines the capacitance between the cathode and gate electrodes. This capacitance influences the charging time of the cathode pulse and the gray scale of the video image. This paper studies a triode structure to find how εd affects the performance, and how to achieve electron beam focusing.
  • Keywords
    capacitance; cathodes; dielectric thin films; electron beam focusing; field emission displays; permittivity; triodes; capacitance; cathode; charging time; dielectric layer; electron beam focusing; emission characteristic; field emission display device; field emitters; gate electrodes; gray scale; permittivity; triode structure; video image; Anodes; Apertures; Capacitance; Cathodes; Dielectrics; Electrodes; Electron beams; Focusing; Nanoelectronics; Permittivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
  • Print_ISBN
    0-7803-8397-4
  • Type

    conf

  • DOI
    10.1109/IVNC.2005.1619620
  • Filename
    1619620