Title :
Harmonic distortion induced by the λ-effect in MOSFET current mirrors
Author :
Agostinho, Peterson R. ; De Lima, Jader A.
Author_Institution :
Miptech-Ind. Autom., São José dos Campos, Brazil
Abstract :
This paper discusses the large-signal harmonic distortion (HD) caused by channel-modulation (λ-effect) on four elementary MOS current mirror (CM) configurations. The third-order equation that relates the incremental gate-source voltage to signal current in CM input transistor is conveniently simplified into a simpler quadratic dependence, so that a tractable expression for the output current is obtained, and therefore, closed-form formulae for HD2 and HD3. The study is supported in good conformity by a set of comparisons between data of HD2 and HD3 from a numerical FFT of the cubic equation and those from simplified expressions. HD is calculated in function of circuit and transistor parameters, providing a deep insight for the choice of CM that best trades off layout area and power consumption to meet a distortion level. A comparative HD analysis from distinct current mirrors is also provided. Among the configurations investigated, the high-swing CM presents better linearity, with HD2 below 0.05% across the range of analysis.
Keywords :
MOSFET circuits; current mirrors; gamma-ray effects; harmonic distortion; numerical analysis; λ-effect; CM input transistor; MOS current mirror configurations; MOSFET current mirrors; channel-modulation; circuit parameters; cubic equation; distortion level; incremental gate-source voltage; large-signal harmonic distortion; layout area; numerical FFT; power consumption; signal current; simpler quadratic dependence; third-order equation; transistor parameters; Harmonic distortion; High definition video; Linearity; Logic gates; Mirrors; Transistors; Channel-Modulation Effect; Current Mirror Linearity; Harmonic Distortion;
Conference_Titel :
Very Large Scale Integration (VLSI-SoC), 2009 17th IFIP International Conference on
Conference_Location :
Florianopolis
Print_ISBN :
978-1-4577-0237-2
DOI :
10.1109/VLSISOC.2009.6041350