Title :
Design of embedded metrology subsystem for intelligent sensing
Author :
Kochan, R. ; Sachenko, A. ; Daponte, P. ; Sobolev, V. ; Kochan, V.
Author_Institution :
Inst. of Comput. Inf. Technol., Temopil, Ukraine
fDate :
6/24/1905 12:00:00 AM
Abstract :
The structure and operating algorithms are synthesizing using the requirements to the embedded system of metrology support. The results of the experimental researches using the metrology software tests are presented in this paper. The experimental researches are presented for K-type thermocouple.
Keywords :
intelligent sensors; thermocouples; ISIS; K-type thermocouple; embedded subsystem; intelligent sensor; metrology software test; metrology support; operating algorithm; Calibration; Embedded system; Error correction; Instruments; Intelligent structures; Intersymbol interference; Mathematical model; Metrology; Sensor phenomena and characterization; Sensor systems;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1007123
