Title :
Ferroelectric domain and d33 measurement in the BiPbFeO3 film
Author :
Huang, Yu-Kuan ; Yu, Chin-Chung ; Chou, Hsiung
Author_Institution :
Dept. of Appl. Phys., Nat. Univ. of Kaohsiung, Kaohsiung, Taiwan
Abstract :
The as-grown ferroelectric domain of the BiPbFeO3 film is characterized by the vertical and lateral piezoresponse force microscope. A stripe domain with cross structure resulted by the spontaneous polarization along the [111] directions of BiPbFeO3 film is observed. The vertical piezoresponse signal, polarization versus voltage curve, is obtained. Based on the amplitude hysteresis curve, the d33 coefficient of the 300 nm-thick BiPbFeO3 film is obtained with a value of around 30.47 pm/V.
Keywords :
bismuth compounds; dielectric hysteresis; dielectric polarisation; electric domains; ferroelectric thin films; lead compounds; BiPbFeO3; [111] directions; amplitude hysteresis curve; d33 measurement; ferroelectric domain; film; piezoresponse force microscope; polarization versus voltage curve; size 300 nm; spontaneous polarization; stripe domain; vertical piezoresponse signal; Atomic force microscopy; Ferroelectric films; Ferroelectric materials; Force measurement; Nonvolatile memory; Physics; Polarization; Sputtering; Temperature; Voltage;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5425021
