• DocumentCode
    1670271
  • Title

    Modeling and Prediction of EEG Signal Using Support Vector Machine

  • Author

    Shen, Minfen ; Lin, Chunhao ; Huang, Jialiang ; Li, Yanxun

  • Author_Institution
    Coll. of Eng., Shantou Univ., Shantou
  • fYear
    2008
  • Firstpage
    1988
  • Lastpage
    1991
  • Abstract
    Electroencephalogram (EEG) is widely regarded as chaotic signal. Modeling and prediction of EEG signals is important for many applications. The methods using support vectors machine (SVM) based on the structure risk minimization provides us an effective way of learning machine. The performance of SVM is much better than the traditional learning machine. Now the SVM is used in classification and regression. But solving the quadratic programming problem for training SVM becomes a bottle-neck of using SVM because of the long time of SVM training. In this paper, a local-SVM method is proposed for predicting the signals. The local method is presented for improving the speed of the prediction of EEG signals. The simulation results show that the training of the local-SVM obtains a good behavior. In addition, the local SVM method significantly improves the prediction precision.
  • Keywords
    chaos; electroencephalography; learning (artificial intelligence); medical signal processing; quadratic programming; regression analysis; signal classification; support vector machines; EEG signal modeling; EEG signal prediction speed; SVM; chaotic signal; classification aspects; electroencephalogram; local-SVM method; machine learning; quadratic programming problem; regression analysis; risk minimization structure; support vector machine; Brain modeling; Chaos; Diseases; Educational institutions; Electroencephalography; Machine learning; Predictive models; Risk management; Support vector machine classification; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bioinformatics and Biomedical Engineering, 2008. ICBBE 2008. The 2nd International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1747-6
  • Electronic_ISBN
    978-1-4244-1748-3
  • Type

    conf

  • DOI
    10.1109/ICBBE.2008.826
  • Filename
    4535706