DocumentCode
1670308
Title
Modeling Business Insights into Predictive Analytics for the Outcome of IT Service Contracts
Author
Megahed, Aly ; Guang-Jie Ren ; Firth, Michael
Author_Institution
IBM Almaden Res. Center, San Jose, CA, USA
fYear
2015
Firstpage
515
Lastpage
521
Abstract
The chances of winning highly valued Information Technology (IT) service contracts are influenced by various factors. Identifying key factors driving the competition and the early prediction of the outcome (either winning or losing such sales opportunities) can have significant business benefits. Given the complexity of IT services, range of potential attributes, and scarcity of comparable data sets, the straightforward approach of developing predictive analytical models that works well in other industries, such as consumer products, tends to achieve lower accuracy in this context. In this paper, we develop an approach that uses business insights and domain knowledge in the classification of several of the attributes influencing the outcome. We show how using this approach in a naïve Bayes predictive analytics framework can vastly improve the prediction accuracy. Further, we discuss two applications of our model, early prioritization of newly validated sales opportunities and optimization of sales force allocation and planning.
Keywords
Bayes methods; business data processing; contracts; sales management; tendering; IT service contracts; attribute classification; business benefits; business insight modeling; consumer products; domain knowledge; information technology service contracts; naïve Bayes predictive analytics framework; prediction accuracy improvement; sales force allocation optimization; sales force planning optimization; sales opportunity prioritization; Accuracy; Analytical models; Contracts; Data models; Force; Predictive models; Deal Bidding; IT Outsourcing; Integer Programming; Naïve Bayes; Predictive Analytics; Sales Force Planning; Service Analytics;
fLanguage
English
Publisher
ieee
Conference_Titel
Services Computing (SCC), 2015 IEEE International Conference on
Conference_Location
New York, NY
Print_ISBN
978-1-4673-7280-0
Type
conf
DOI
10.1109/SCC.2015.76
Filename
7207394
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