Low cost test for catastrophic faults in CMOS operational transcondutor

Author

Fouad, Mahmoud M. ; Amer, Hassanein H. ; Madian, Ahmed H. ; Abdelhalim, M.B.

Author_Institution

Electron. & Commun. Dept., Cairo Univ., Cairo, Egypt

fYear

2011

Firstpage

1

Lastpage

5

Abstract

In this paper, a test is developed for the Operational Transconductor (OTA). The technology used is the 90nm CMOS technology. The assumed fault model consists of six faults per transistor including the open-gate fault. It is proven that only two test values are enough to detect 34 of the possible 36 faults, i.e., a coverage of 94.4%. A Monte Carlo analysis is then performed to study the effect, on test coverage, of changing the value of the resistive short in the fault model. It is found that the same two test values still guarantee 94.4% coverage irrespective of the value of the short.

Keywords

CMOS analogue integrated circuits; Monte Carlo methods; integrated circuit testing; operational amplifiers; CMOS operational transcondutor; Monte Carlo analysis; catastrophic fault; low cost testing; open-gate fault; size 90 nm; CMOS integrated circuits; Circuit faults; Integrated circuit modeling; Logic gates; Resistance; Testing; Transistors; Analog Testing; CMOS; Transcondcutor; fault model; minimum test;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics (ICM), 2011 International Conference on

Conference_Location

Hammamet

Print_ISBN

978-1-4577-2207-3

Type

conf

DOI

10.1109/ICM.2011.6177397

Filename

6177397