• DocumentCode
    1670801
  • Title

    CIRCUIT DESIGN FOR BUILT-IN CURRENT TESTING

  • Author

    Miura, Yukiya ; Kinoshita, Kozo

  • fYear
    1992
  • Firstpage
    873
  • Keywords
    Circuit faults; Circuit synthesis; Circuit testing; Clocks; Current measurement; Electrical fault detection; Integrated circuit testing; Test equipment; Time measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527913
  • Filename
    527913
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1670801