DocumentCode :
1670876
Title :
Measuring in-band distortions of mixers
Author :
Geens, Alain ; Rolain, Yves ; Vanhoenacker, Kenneth ; Schoukens, Johan
Author_Institution :
Dept. ELEC/TW, Vrije Univ., Brussels, Belgium
Volume :
2
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1335
Abstract :
This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.
Keywords :
electric distortion measurement; mixers (circuits); nonlinear distortion; in-band distortion; local oscillator; measurement technique; mixer; nonlinear distortion; three-port device; two-port device; Active noise reduction; Circuit noise; Design methodology; Distortion measurement; Frequency conversion; Linear systems; Local oscillators; Measurement techniques; Nonlinear distortion; Stochastic processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-7218-2
Type :
conf
DOI :
10.1109/IMTC.2002.1007150
Filename :
1007150
Link To Document :
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