• DocumentCode
    1670876
  • Title

    Measuring in-band distortions of mixers

  • Author

    Geens, Alain ; Rolain, Yves ; Vanhoenacker, Kenneth ; Schoukens, Johan

  • Author_Institution
    Dept. ELEC/TW, Vrije Univ., Brussels, Belgium
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1335
  • Abstract
    This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.
  • Keywords
    electric distortion measurement; mixers (circuits); nonlinear distortion; in-band distortion; local oscillator; measurement technique; mixer; nonlinear distortion; three-port device; two-port device; Active noise reduction; Circuit noise; Design methodology; Distortion measurement; Frequency conversion; Linear systems; Local oscillators; Measurement techniques; Nonlinear distortion; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7218-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2002.1007150
  • Filename
    1007150