• DocumentCode
    1670892
  • Title

    High frequency input impedance characterization of dielectric films for power-ground planes

  • Author

    Obrzut, J.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    2
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1341
  • Abstract
    Broadband impedance characterization of high-k films was performed in the frequency range of 100 MHz to 10 GHz using a coaxial test fixture configuration. The electrical characteristic of high-k films was found to be consistent with a capacitance load, without noticeable contribution from the circuit inductance that typically dominates the high frequency response. An intrinsic high frequency relaxation process was analyzed in high-k organic-ceramic hybrid materials. The resulting dielectric dispersion and the corresponding dielectric loss can suppress the resonant standing waves in power-ground planes.
  • Keywords
    dielectric losses; dielectric measurement; dielectric relaxation; dielectric thin films; electric impedance measurement; permittivity; 100 MHz to 10 GHz; broadband measurement; capacitance load; circuit inductance; coaxial test fixture; decoupling capacitance; dielectric dispersion; dielectric loss; dielectric relaxation; electrical characteristics; high-frequency input impedance; high-k dielectric film; organic-ceramic hybrid material; power-ground plane; resonant standing wave; Circuit testing; Coaxial components; Dielectric films; Dielectric losses; Fixtures; Frequency; High K dielectric materials; High-K gate dielectrics; Impedance; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-7218-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2002.1007151
  • Filename
    1007151