Title :
Generalised calibration schemes for precision RF vector network analyser measurements
Author :
Morgan, A.G. ; Ridler, N.M. ; Salter, M.J.
Author_Institution :
Nat. Phys. Lab., UK
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper discusses RF calibration schemes for one-port vector network analysers other than the traditional short-open-load scheme. Before use, the calibration standards are characterised by fitting polynomials to measured voltage reflection coefficient values. Simulated uncertainty profiles and examples of measurement uncertainties obtained for various calibration schemes are presented. A method of adaptively choosing the best calibration scheme for a particular device at a particular frequency is suggested.
Keywords :
calibration; electric impedance measurement; electromagnetic wave reflection; measurement uncertainty; network analysers; standards; RF impedance; adaptive calibration scheme choice; calibration device; calibration frequency; characterised calibration standards; measurement uncertainties; network analyser generalised calibration schemes; one-port vector network analysers; polynomial fitting; precision RF vector network analyser measurements; reflectometry; short-open-load calibration schemes; uncertainty profiles; voltage reflection coefficient measurement; Calibration; Electrical resistance measurement; Frequency measurement; Impedance measurement; Measurement standards; Polynomials; Radio frequency; Transmission line measurements; Uncertainty; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1007154
