• DocumentCode
    1670954
  • Title

    Transient measurement of laser wakefield at the SILEX-I: Ti: Sapphire laser

  • Author

    Dong, Jun ; Peng, Zhi-tao ; Lu, Zhong-gui ; Sun, Zhi-hong ; Wang, Xiao-dong ; Su, Jing-qin ; Xie, Na ; Xia, Yan-wen ; Guo, Yi ; Sun, Li ; Wu, Yu-chi ; Zhu, Bin ; Tang, Jun ; Liu, Hua ; Yuan, Hao-yu

  • Author_Institution
    Res. Center of Laser Fusion, CAEP, Mianyang, China
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Based on single-shot spectral interferometry, transient measuring technology of laser wakefield at the SILEX-I: Ti: Sapphire Laser is developed. The wakefield is captured with ~140 fs resolution over a temporal region of 1 ps.
  • Keywords
    laser beam effects; laser variables measurement; light interferometry; sapphire; solid lasers; titanium; wakefield accelerators; Al2O3:Ti; laser wakefield; single shot spectral interferometry; solid laser; transient measurement; Chirp; Frequency domain analysis; Laser beams; Laser excitation; Measurement by laser beam; Probes; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326314
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1670954