• DocumentCode
    1671248
  • Title

    Test case generation of a protocol by a fault coverage analysis

  • Author

    Kim, Tae-hyong ; Hwang, Ik-soon ; Jang, Min-seok ; Kang, Sung-won ; Lee, Jai-Yong ; Lee, Sang-Bae

  • Author_Institution
    Dept. of Electron. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    1998
  • Firstpage
    690
  • Lastpage
    695
  • Abstract
    In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying `all-du-paths´ criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method
  • Keywords
    conformance testing; finite state machines; formal specification; formal verification; protocols; communication protocol; conformance test; data elements; data flow test cases; extended finite state machine; fault coverage analysis; inter-dependency problem; probable fault models; protocol; test case generation; Collaborative software; Computer aided software engineering; Computer science; Data analysis; Electronic equipment testing; Explosions; Protocols; Research and development; Software testing; Telecommunication control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Networking, 1998. (ICOIN-12) Proceedings., Twelfth International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-8186-7225-0
  • Type

    conf

  • DOI
    10.1109/ICOIN.1998.648603
  • Filename
    648603