1671415

Bridging defects resistance measurements in a CMOS process

Rodriguez-Montañés, R. ; Bruis, E.M.J.G. ; Figueras, J.

1995

892

Bridge circuits; CMOS process; Circuit faults; Circuit testing; Electrical resistance measurement; Failure analysis; Monitoring; Petroleum; Very large scale integration; Wafer bonding;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527915

527915