• DocumentCode
    1671415
  • Title

    Bridging defects resistance measurements in a CMOS process

  • Author

    Rodriguez-Montañés, R. ; Bruis, E.M.J.G. ; Figueras, J.

  • fYear
    1995
  • Firstpage
    892
  • Keywords
    Bridge circuits; CMOS process; Circuit faults; Circuit testing; Electrical resistance measurement; Failure analysis; Monitoring; Petroleum; Very large scale integration; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527915
  • Filename
    527915
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1671415