Title :
Experimental investigation of transparent silicon carbide as a promising material for atom chips
Author :
Huet, Landry ; Ammar, Mahdi ; Morvan, Erwan ; Sarazin, Nicolas ; Pocholle, Jean-Paul ; Reichel, Jakob ; Guerlin, Christine ; Schwartz, Sylvain
Author_Institution :
Thales Research and Technology France, Campus Polytechnique, 1 av. Fresnel, 91767 Palaiseau, France
Abstract :
We experimentally investigate the possibility of exploiting optical transparency and favorable thermal behavior of silicon carbide for atom chips, and discuss potential applications including high numerical aperture detection through the chip.
Keywords :
Atom optics; Atomic layer deposition; Charge carrier processes; Magnetooptic effects; Optical polarization; Silicon carbide; Substrates;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
978-1-4673-1839-6
