• DocumentCode
    1671446
  • Title

    Experimental investigation of transparent silicon carbide as a promising material for atom chips

  • Author

    Huet, Landry ; Ammar, Mahdi ; Morvan, Erwan ; Sarazin, Nicolas ; Pocholle, Jean-Paul ; Reichel, Jakob ; Guerlin, Christine ; Schwartz, Sylvain

  • Author_Institution
    Thales Research and Technology France, Campus Polytechnique, 1 av. Fresnel, 91767 Palaiseau, France
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We experimentally investigate the possibility of exploiting optical transparency and favorable thermal behavior of silicon carbide for atom chips, and discuss potential applications including high numerical aperture detection through the chip.
  • Keywords
    Atom optics; Atomic layer deposition; Charge carrier processes; Magnetooptic effects; Optical polarization; Silicon carbide; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1671446