Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits

Author

Alippi, C. ; Catelani, M. ; Fort, A. ; Mugnaini, M.

Author_Institution

Dipt. di Elettronica e Inf., Politecnico di Milano, Italy

Volume

2

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

1503

Abstract

This paper addresses the problem of automated fault diagnosis in analog electronic circuits, based on Simulation Before Test techniques. The diagnosis is obtained by comparing the faulty circuit signature with a set of examples contained in a fault dictionary. A method for improving the fault dictionary is presented, based on a global sensitivity analysis method and on a fuzzy processing method applied to the obtained sensitivity curves.

Keywords

analogue circuits; biquadratic filters; circuit simulation; fault diagnosis; fuzzy set theory; radial basis function networks; randomised algorithms; sensitivity analysis; transfer functions; RBF neural classifier; analog circuits; automated fault diagnosis; automatic test frequencies selection; biquad filter; fault dictionary; faulty circuit signature; fuzzy processing method; global sensitivity analysis; harmonic analysis; poly-time complexity; randomized algorithms; sensitivity curves; simulation before test techniques; sinusoidal waves; soft faults; transfer function; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electronic circuits; Electronic equipment testing; Fault diagnosis; Frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE

ISSN

1091-5281

Print_ISBN

0-7803-7218-2

Type

conf

DOI

10.1109/IMTC.2002.1007181

Filename

1007181