Title :
Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits
Author :
Alippi, C. ; Catelani, M. ; Fort, A. ; Mugnaini, M.
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
fDate :
6/24/1905 12:00:00 AM
Abstract :
This paper addresses the problem of automated fault diagnosis in analog electronic circuits, based on Simulation Before Test techniques. The diagnosis is obtained by comparing the faulty circuit signature with a set of examples contained in a fault dictionary. A method for improving the fault dictionary is presented, based on a global sensitivity analysis method and on a fuzzy processing method applied to the obtained sensitivity curves.
Keywords :
analogue circuits; biquadratic filters; circuit simulation; fault diagnosis; fuzzy set theory; radial basis function networks; randomised algorithms; sensitivity analysis; transfer functions; RBF neural classifier; analog circuits; automated fault diagnosis; automatic test frequencies selection; biquad filter; fault dictionary; faulty circuit signature; fuzzy processing method; global sensitivity analysis; harmonic analysis; poly-time complexity; randomized algorithms; sensitivity curves; simulation before test techniques; sinusoidal waves; soft faults; transfer function; Analog circuits; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Electronic circuits; Electronic equipment testing; Fault diagnosis; Frequency;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
Print_ISBN :
0-7803-7218-2
DOI :
10.1109/IMTC.2002.1007181
