Title :
A 19.5b dynamic range CMOS image sensor with 12b column-parallel cyclic A/D converters
Author :
Mase, Mitsuhito ; Kawahito, Shoji ; Sasaki, Masaaki ; Wakamori, Yasuo
Author_Institution :
Shizuoka Univ., Hamamatsu, Japan
Abstract :
A CMOS image sensor with 117 dB DR is demonstrated in a 0.25 μm CMOS technology through merging of multiple exposures. A 12b cyclic ADC with integrated noise canceling is implemented in the column of the image sensor and achieves a DNL of +0.4/-0.8 LSB.
Keywords :
CMOS image sensors; analogue-digital conversion; integrated circuit design; integrated circuit measurement; integrated circuit noise; interference suppression; 0.25 micron; 12 bit; CMOS image sensor; DNL; LSB; column-parallel cyclic A/D converters; cyclic ADC; dynamic range; image sensor column implementation; integrated noise canceling; multiple exposure merging; CMOS image sensors; Capacitors; Circuits; Dynamic range; Educational institutions; Image converters; Image sampling; Lighting; Noise cancellation; Operational amplifiers;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1494013
