DocumentCode :
1672145
Title :
83% Boost in external quantum efficiency of large-area 380 nm flip-chip light-emitting diodes by incorporating a self-textured oxide mask structure
Author :
Lin, Wen-Yu ; Shen, Kun-Ching ; Wuu, Dong-Sing ; Huang, Shih-Cheng ; Horng, Ray-Hua
Author_Institution :
Dept. of Mater. Sci. & Eng., Nat. Chung Hsing Univ., Taichung, Taiwan
fYear :
2012
Firstpage :
1
Lastpage :
2
Abstract :
The enhanced output of 380nm flip-chip light-emitting diode is demonstrated by inserting self-textured oxide structures, which was attributed the oxide structure existence not only reduces dislocation density but also intensifies the light extraction.
Keywords :
flip-chip devices; light emitting diodes; dislocation density; external quantum efficiency; flip-chip light-emitting diodes; light extraction; self-textured oxide mask structure; self-textured oxide structures; size 380 nm; Arrays; Educational institutions; Epitaxial layers; Flip chip; Gallium nitride; Light emitting diodes; Power generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
Type :
conf
Filename :
6326362
Link To Document :
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