Title :
Fabrication and characterization of ordered GeSi nanoislands on Si (001) substrates
Author :
Zhong, Zhenyang ; Chen, Yanwu ; Pan, Bingying ; Yanwu Chen ; An, Zhenhua ; Lu, Fang ; Jiang, Zuimin
Author_Institution :
Dept. of Phys., Fudan Univ., Shanghai, China
Abstract :
Ordered GeSi nanoislands were fabricated in combination of self-assembly and nanosphere lithography on Si (001) substrates. Well ordered pits in a hexagonal lattice on Si (001) substrates are readily obtained via nanosphere lithography. The preferential nucleation of GeSi nanoislands in the pits results in laterally ordered nanoislands on such prepatterned Si (001) surface during Ge deposition. Multilayer GeSi nanoislands separated by thin Si spacer layers were also realized. The vertical alignment of nanoislands along the growth direction can give rise to three-dimensionally ordered nanoislands or nanoisland crystal. To explore the optoelectronic properties of ordered nanoislands, A Si p-i-n diode embedded with multilayer ordered GeSi nanoislands were fabricated. Photoluminescence of the samples with multilayer GeSi nanoislands were studied.
Keywords :
Ge-Si alloys; multilayers; nanolithography; nanopatterning; nanostructured materials; nucleation; p-i-n diodes; photoluminescence; self-assembly; semiconductor materials; Ge deposition; GeSi-Si; Si; Si (001) substrates; growth direction; hexagonal lattice; laterally ordered nanoislands; multilayer nanoislands; nanoisland crystal; nanosphere lithography; optoelectronic property; ordered nanoislands; photoluminescence; pits; preferential nucleation; self-assembly; silicon p-i-n diode; silicon spacer layers; three-dimensionally ordered nanoislands; Fabrication; Germanium silicon alloys; Laboratories; Lithography; Nanobioscience; Nonhomogeneous media; Physics; Self-assembly; Silicon germanium; Surface morphology;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5425100