DocumentCode
1672683
Title
Photoresponse characteristics of vertically aligned ZnO nanowires
Author
Kar, J.P. ; Das, S.N. ; Choi, J.H. ; Lee, T.I. ; Myoung, J.M.
Author_Institution
Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
fYear
2010
Firstpage
951
Lastpage
952
Abstract
In this study, vertically aligned ZnO nanowires were grown by metal organic chemical vapor deposition (MOCVD) method. The growth direction of vertically aligned nanowires was along c-axis. For monolithic integration, vertically aligned ZnO nanowires were grown on AlN/Si substrates with a higher aspect ratio in comparison to those on bare silicon substrates. In a separate experiment, micro-patterning of the nanowires was obtained by lift-off technique, where BaF2 film was used as a sacrificial layer. ZnO nanowires based UV detectors were fabricated using silicon microchannel. Nanowires with higher aspect ratio exhibited the highest on-off current ratio and less photoresponse time.
Keywords
II-VI semiconductors; III-V semiconductors; MOCVD coatings; aluminium compounds; elemental semiconductors; microfabrication; nanowires; photodetectors; semiconductor growth; semiconductor quantum wires; semiconductor thin films; silicon; ultraviolet detectors; wide band gap semiconductors; zinc compounds; AlN; MOCVD; Si; UV detectors; ZnO-AlN; ZnO-Si; aluminium nitride-silicon substrates; film; growth direction; lift-off technique; metal organic chemical vapor deposition method; micropatterning; monolithic integration; on-off current ratio; photoresponse; sacrificial layer; separate experiment; silicon microchannel; vertically aligned nanowires; Chemical vapor deposition; Detectors; MOCVD; Microchannel; Monolithic integrated circuits; Nanowires; Organic chemicals; Silicon; Substrates; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5425109
Filename
5425109
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