Title :
FPGA Redundancy Configurations: An Automated Design Space Exploration
Author :
Anwer, Jahanzeb ; Platzner, Marco ; Meisner, Sebastian
Author_Institution :
Univ. of Paderborn, Paderborn, Germany
Abstract :
With ever-decreasing CMOS transistor sizes, integrated circuits are becoming more and more susceptible to errors. A commonly used approach to improve the reliability of digital circuits is triple modular redundancy (TMR). TMR instantiates three copies of a circuit plus additional voter circuits to take majority decisions on the output values. Prior research has studied variations in TMR voting structures that bring about improvements in performance factors such as area utilization, power consumption and latency at the price of slight degradation in output reliability. In this paper, we extend previous studies by utilizing different redundancy configurations and voter-insertion algorithms to observe variation in these performance factors for FPGA designs. To maintain an automated tool flow for redundancy insertion into a digital design, we enhance the functionality of the previous BYU-LANL TMR tool to include alternative TMR and cascaded TMR redundancy configurations. Design space exploration experiments with different ISCAS circuit benchmarks show that the choice of an appropriate redundancy configuration and voter-insertion algorithm has a strong impact on optimizing performance factors. To support a designer with selecting a redundant implementation, we present a design space exploration tool flow that takes a circuit as input and identifies Pareto-optimal implementations with respect to the four objectives reliability level, utilized FPGA area, latency and dynamic power consumption.
Keywords :
design engineering; field programmable gate arrays; redundancy; BYU-LANL TMR tool; CMOS transistor sizes; FPGA design; FPGA redundancy configurations; ISCAS circuit benchmarks; TMR voting structures; automated design space exploration; automated tool flow; cascaded TMR redundancy configurations; design space exploration tool flow; digital circuits; digital design; dynamic power consumption; integrated circuits; latency; output reliability; reliability level; triple modular redundancy; voter circuits; voter insertion algorithm; Algorithm design and analysis; Benchmark testing; Field programmable gate arrays; Power demand; Redundancy; Tunneling magnetoresistance; BYU-LANL TMR tool; Redundancy configurations; Reliability; Voter-insertion algorithms;
Conference_Titel :
Parallel & Distributed Processing Symposium Workshops (IPDPSW), 2014 IEEE International
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4799-4117-9
DOI :
10.1109/IPDPSW.2014.37