• DocumentCode
    1673042
  • Title

    Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation

  • Author

    Chen, W. -Y ; Chen, M. -J ; Cheng, C. -C ; Wang, C. -J ; Chyi, J. -I ; Hsu, T.M.

  • Author_Institution
    Dept. of Phys., Nat. Central Univ., Jhongli, Taiwan
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nano-size oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.
  • Keywords
    atomic force microscopy; finite difference time-domain analysis; nanophotonics; perturbation techniques; atomic force microscope oxidation; electric field distributions; extremely local perturbation; finite-difference time-domain calculations; high spatial resolution; image contrast; imaging resonant modes; nanooxidation; photonic crystal nanocavity; Atomic force microscopy; Cavity resonators; Electric fields; Force; Photonic crystals; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO), 2012 Conference on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-1839-6
  • Type

    conf

  • Filename
    6326394