DocumentCode
1673042
Title
Imaging resonant modes in photonic crystal nanocavity by atomic force microscope nano-oxidation
Author
Chen, W. -Y ; Chen, M. -J ; Cheng, C. -C ; Wang, C. -J ; Chyi, J. -I ; Hsu, T.M.
Author_Institution
Dept. of Phys., Nat. Central Univ., Jhongli, Taiwan
fYear
2012
Firstpage
1
Lastpage
2
Abstract
Electric field distributions of resonant modes in a photonic crystal nanocavity were imaged using atomic force microscope nano-oxidation. A grid pattern of nano-size oxides was grown on the nanocavity to perturb the resonant modes. The perturbation caused a shift in the resonant wavelength that was proportional to the local electric field intensity of the resonant mode. The experimentally obtained field intensity images agreed excellently with the finite-difference time-domain calculations. The measured resonant mode images had high spatial resolution and image contrast, owing to the extremely local perturbation of the atomic force microscope oxidation technique.
Keywords
atomic force microscopy; finite difference time-domain analysis; nanophotonics; perturbation techniques; atomic force microscope oxidation; electric field distributions; extremely local perturbation; finite-difference time-domain calculations; high spatial resolution; image contrast; imaging resonant modes; nanooxidation; photonic crystal nanocavity; Atomic force microscopy; Cavity resonators; Electric fields; Force; Photonic crystals; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-4673-1839-6
Type
conf
Filename
6326394
Link To Document