Title :
Defect characterization and testing of QCA devices and circuits: A survey
Author :
Dhare, Vaishali ; Mehta, Usha
Author_Institution :
Inst. of Technol., Nirma Univ., Ahmedabad, India
Abstract :
QCA (Quantum-dot Cellular Automata) is the promising future nanotechnology for computing. In QCA, the cells must be aligned properly at nano scales for proper functioning. Defects may occur in synthesis and deposition phase. So the defect analyses and testing cannot be ignored. This paper presents a survey on QCA basics, defect characterization and various testing aspects of QCA.
Keywords :
cellular automata; integrated circuit testing; nanotechnology; quantum dots; QCA devices; defect analyses; defect characterization; defect testing; nanotechnology; quantum-dot cellular automata; Automata; Circuit faults; Clocks; Logic gates; Nanotechnology; Quantum dots; Testing; QCA; defect; quantum-dot; testing;
Conference_Titel :
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location :
Ahmedabad
Print_ISBN :
978-1-4799-1742-6
DOI :
10.1109/ISVDAT.2015.7208060
