• DocumentCode
    1673142
  • Title

    Defect characterization and testing of QCA devices and circuits: A survey

  • Author

    Dhare, Vaishali ; Mehta, Usha

  • Author_Institution
    Inst. of Technol., Nirma Univ., Ahmedabad, India
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    QCA (Quantum-dot Cellular Automata) is the promising future nanotechnology for computing. In QCA, the cells must be aligned properly at nano scales for proper functioning. Defects may occur in synthesis and deposition phase. So the defect analyses and testing cannot be ignored. This paper presents a survey on QCA basics, defect characterization and various testing aspects of QCA.
  • Keywords
    cellular automata; integrated circuit testing; nanotechnology; quantum dots; QCA devices; defect analyses; defect characterization; defect testing; nanotechnology; quantum-dot cellular automata; Automata; Circuit faults; Clocks; Logic gates; Nanotechnology; Quantum dots; Testing; QCA; defect; quantum-dot; testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design and Test (VDAT), 2015 19th International Symposium on
  • Conference_Location
    Ahmedabad
  • Print_ISBN
    978-1-4799-1742-6
  • Type

    conf

  • DOI
    10.1109/ISVDAT.2015.7208060
  • Filename
    7208060
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1673142