DocumentCode :
1673411
Title :
4 GHz high-power high-efficiency pseudomorphic power HEMT
Author :
Fu, S.T. ; Kopp, W.F. ; Kao, M.Y. ; Duh, K.H.G. ; Smith, P.M. ; Chao, P.C. ; Yu, T.H.
Author_Institution :
General Electric Co., Syracuse, NY, USA
fYear :
1993
Firstpage :
1469
Abstract :
The power performance of 0.25- mu m*8-mm double recessed GaAs-based pseudomorphic high electron mobility transistors (PHEMTs) at 4 GHz is reported. The 0.25- mu m-gate-length PHEMTs exhibit typical gate-to-drain breakdown voltage of more than 20 V, peak transconductance of 430 mS/mm, and maximum drain current density of 450 mA/mm. When the drain was biased up to 11 V, the device delivered 5.7-W output power with 12.6-dB power gain and 57% power-added efficiency (PAE). The device demonstrates an extremely broad drain bias range for efficient operation. It exhibits a maximum PAE of 72% with an output power of 4.1 W under a V/sub DS/=7 V condition. with 8-V drain bias, when the device was tuned for maximum output power, it delivered 4.3 W of P/sub 2dB/ with 15.4-dB power gain and 66% PAE.<>
Keywords :
III-V semiconductors; gallium arsenide; high electron mobility transistors; power transistors; solid-state microwave devices; 0.25 micron; 12.6 dB; 15.4 dB; 4 GHz; 4.1 W; 4.3 W; 5.7 W; 57 percent; 66 percent; 7 V; 72 percent; 8 V; PHEMTs; double recessed GaAs-based pseudomorphic high electron mobility transistors; drain bias range; gate-to-drain breakdown voltage; maximum drain current density; peak transconductance; power gain; power-added efficiency; pseudomorphic power HEMT; Etching; Gallium arsenide; HEMTs; MESFETs; MODFETs; PHEMTs; Performance gain; Power amplifiers; Power generation; Solid state circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-1209-0
Type :
conf
DOI :
10.1109/MWSYM.1993.276720
Filename :
276720
Link To Document :
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