DocumentCode :
1673459
Title :
An inductorless receiver front-end for multiband wireless applications
Author :
Sharma, Priyanka ; Pandey, Sunil ; Dwaramwar, Pravin A.
Author_Institution :
Dept. of Electron. Eng., RCOEM, Nagpur, India
fYear :
2015
Firstpage :
1
Lastpage :
5
Abstract :
In order to support a wide set of communication standards and to accommodate different applications in a single device, broadband receivers are essential and inevitably in demand. A wideband low-noise amplifier (LNA), which is a key block in the design of broadband receivers for multiband wireless communication standards, is proposed. A differential common-gate (CG) LNA utilizing multiple-feedback technique is presented. The multiple-feedback technique adds degrees of freedom in the choice of the LNA transconductance to reduce the noise figure (NF) and increase the amplification. It avoids the use of bulky inductors resulting in considerable area and cost savings. The LNA is designed and simulated in 180 nm CMOS technology. It covers the frequency range of 0.8 GHz to 2 GHz. The designed and simulated LNA delivers a maximum voltage gain of 12.2 dB, a minimum NF of 2.56 dB, a third-order input intercept point IIP3 of -6.5 dBm and 3.6 mW of power consumption with input matching (S11<; -10 dB).
Keywords :
CMOS integrated circuits; UHF amplifiers; feedback amplifiers; low noise amplifiers; radar receivers; wideband amplifiers; CMOS technology; broadband receiver; differential CG LNA; differential common-gate LNA; frequency 0.8 GHz to 2 GHz; inductorless receiver front-end; input matching; multiband wireless communication standard applications; multiple-feedback technique; noise figure 2.56 dB; noise figure reduction; power 3.6 mW; power consumption; size 180 nm; wideband low-noise amplifier transconductance; CMOS integrated circuits; CMOS technology; Gain; Impedance matching; Noise; Noise measurement; Wideband; Common gate (CG); inductor-less; low-noise amplifier (LNA); noise figure (NF); wideband LNA;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location :
Ahmedabad
Print_ISBN :
978-1-4799-1742-6
Type :
conf
DOI :
10.1109/ISVDAT.2015.7208070
Filename :
7208070
Link To Document :
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