• DocumentCode
    1673484
  • Title

    Novel SJ-LDMOS on SOI with Step Doping Surface-Implanted Layer

  • Author

    Chen, Wanjun ; Zhang, Bo ; Li, Zhaoji

  • Author_Institution
    Univ. of Electron. Sci. & Technol. of China, Sichuan
  • fYear
    2007
  • Firstpage
    1256
  • Lastpage
    1259
  • Abstract
    A super-junction (SJ) SOI-LDMOS with step doping surface-implanted n-type layer is proposed and optimized which allows high breakdown voltage (BV) and low on-resistance (Ron). The proposed structure overcomes the field effect action in conventional SJ SOI-LDMOS devices thus achieving the charge compensation between the n and p pillars as well as a near uniform electric field distribution in the drift region in the off-state. The surface-implanted layer also provides a low current path in the on-state. The simulation results show that an increase in the off-state BV by 55% and a reduction of the specific on-resistance by 37.4% are obtained for the proposed device when compared with those of the conventional one.
  • Keywords
    charge compensation; electric breakdown; electric fields; field effect devices; silicon-on-insulator; breakdown voltage; charge compensation; field effect action; step doping surface-implanted layer; superjunction SOI-LDMOS; uniform electric field distribution; Automotive engineering; Doping profiles; Laboratories; Low voltage; MOS capacitors; MOSFETs; Silicon on insulator technology; Surface resistance; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Circuits and Systems, 2007. ICCCAS 2007. International Conference on
  • Conference_Location
    Kokura
  • Print_ISBN
    978-1-4244-1473-4
  • Type

    conf

  • DOI
    10.1109/ICCCAS.2007.4348275
  • Filename
    4348275