Title :
A rigorous analysis of the higher order modes and attenuation of stripline of arbitrary dimensions
Author :
Burchett, M.H. ; Pennock, S.R. ; Shepherd, P.R.
Author_Institution :
Sch. of Electron. & Electr. Eng., Bath Univ., UK
Abstract :
A rigorous and computationally efficient analysis for stripline of arbitrary dimensions based on the transverse resonance diffraction technique is presented. Calculated higher-order-mode cutoff frequencies show excellent agreement, and the calculated attenuation factor shows good agreement with measured values. The calculated values are more accurate than predictions from numerical or analytical techniques. With the approach considered here, considerably less time is required to compute the data, and the algorithm can be programmed on a desktop computer.<>
Keywords :
electromagnetic wave diffraction; electromagnetic wave scattering; electronic engineering computing; strip lines; arbitrary dimensions; attenuation; cutoff frequencies; desktop computer; modes; rigorous analysis; stripline; transverse resonance diffraction technique; Antenna measurements; Attenuation; Conformal mapping; Cutoff frequency; Diffraction; Equations; Load flow; Resonance; Stripline; Surface resistance;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.276724