Title :
Error analysis of optoelectronic frequency response measurement of photodiodes using high-extinction ratio Mach-Zehnder modulator
Author :
Inagaki, K. ; Mankong, Ukrit ; Kawanishi, Tetsuyas
Author_Institution :
Lightwave Device Lab., Nat. Inst. of Inf. & Commun. Technol. (NICT), Koganei, Japan
Abstract :
We analyze the errors of a newly proposed measurement method on optoelectronic frequency response of photodiodes, which uses a high-extinction ratio Mach-Zehnder modulator to generate a two-tone stimulus lightwave. Five major error factors are identified and analyzed quantitatively. The result shows that the evaluated combined uncertainty is expected to be less than 0.5 dB.
Keywords :
frequency response; optical modulation; photodiodes; Mach-Zehnder modulator; error analysis; high-extinction ratio; optoelectronic frequency response measurement; photodiodes; two-tone stimulus lightwave; Error analysis; Frequency response; Heterodyne principle; Mach-Zehnder modulator; Photo-diode;
Conference_Titel :
Optical Communications and Networks (ICOCN), 2012 11th International Conference on
Conference_Location :
Chonburi
Print_ISBN :
978-1-4673-4957-4
Electronic_ISBN :
978-1-4673-4958-1
DOI :
10.1109/ICOCN.2012.6486225
