DocumentCode
1673554
Title
Timing model for two stage buffer and its application in ECSM characterization
Author
Chaurasiya, Yogesh ; Bhargava, Surabhi ; Sharma, Arvind ; Kaur, Baljit ; Anand, Bulusu
Author_Institution
Indian Inst. of Technol., Roorkee, Roorkee, India
fYear
2015
Firstpage
1
Lastpage
6
Abstract
At nanometer technology nodes, variability is a major roadblock for circuit performance. This has made timing estimation of circuits a tedious task. Effective Current Source Model (ECSM) characterization of standard cells has been evolved to solve this issue. In this paper, an analytical Threshold Crossing Point (TCP) model for a two stage buffer is derived. Proposed model relates TCPs with the input transition time (TR) and load capacitance (Cl). Region of validity of the model is also derived in (Cl, TR) space. Relationship of model coefficients and region of validity with cell size is also derived. Furthermore, the proposed model is implemented in ECSM characterization of the buffer cell. It has been shown that ECSM characterization using proposed model results in 50% reduction of HSPICE simulations. Thus proposed model can be used to simplify the standard cell characterization methodology as it requires lesser number of simulations and gives values differing by a maximum of 2% from the actual values obtained using HSPICE simulations.
Keywords
buffer circuits; estimation theory; nanotechnology; timing circuits; ECSM characterization; HSPICE simulations; TCP model; buffer cell; effective current source model; load capacitance; nanometer technology; threshold crossing point model; timing circuit estimation; transition time; Analytical models; Integrated circuit modeling; Load modeling; Mathematical model; Semiconductor device modeling; Standards; Timing; CMOS buffer; ECSM characterization; threshold crossing points; timing model;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location
Ahmedabad
Print_ISBN
978-1-4799-1742-6
Type
conf
DOI
10.1109/ISVDAT.2015.7208075
Filename
7208075
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