• DocumentCode
    1673651
  • Title

    Parametric interactions in high-T/sub c/ superconducting step edge junctions at X-band

  • Author

    Kain, A.Z. ; Fetterman, H.R.

  • Author_Institution
    TRW, Redondo Beach, CA, USA
  • fYear
    1993
  • Firstpage
    1425
  • Abstract
    The authors have fabricated and tested both single junctions and series arrays of YBCO step edge junctions for four photon parametric effects at X band as a first step in developing a parametric amplifier at 60 GHz. The series array of 25 junctions at 10.3 GHz shows a 10-dB increase in reflected signal power as the pump power is increased, while the single junction at 12.2 GHz indicates a 2-dB change. The reflected power at the characteristic idler frequency of 2 omega /sub p/- omega /sub s/ is evidence of true Josephson junction parametric interaction. The use of thallium-based films at 60 GHz, which offer a broader range of operating temperatures than does YBCO, is currently being investigated. The design being considered for a parametric amplifier at V band is a combination of microstrip-based series arrays of junctions and an antipodal finline transition.<>
  • Keywords
    Josephson effect; high-temperature superconductors; microstrip lines; microwave parametric amplifiers; superconducting junction devices; superconducting microwave devices; 10.3 GHz; 12.2 GHz; 60 GHz; Josephson junction parametric interaction; V band; X-band; YBaCuO; antipodal finline transition; high-T/sub c/ superconducting step edge junctions; idler frequency; microstrip-based series arrays; parametric amplifier; photon parametric effects; pump power; reflected signal power; series arrays; Admittance; Circuits; Electronic equipment testing; Frequency; High temperature superconductors; Josephson junctions; Phased arrays; Superconducting microwave devices; Temperature distribution; Yttrium barium copper oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276730
  • Filename
    276730