• DocumentCode
    1673668
  • Title

    Tunable high temperature superconductor microstrip resonators

  • Author

    Beall, J.A. ; Ono, R.H. ; Galt, D. ; Price, J.C.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    1993
  • Firstpage
    1421
  • Abstract
    Electrically tunable high-temperature superconductor microstrip resonators incorporating YBa/sub 2/Cu/sub 3/O/sub 7-x/ superconductor and SrTiO/sub 3/ ferroelectric films have been fabricated and characterized. The resonators consist of two collinear microstrip line sections separated by a 5- mu m gap. The capacitance of the gap influences the frequencies of the odd-order coupled resonances. Inductively choked DC bias lines are attached to each line section so that a bias voltage can be applied to the gap. When the gap is filled with a ferroelectric material, the odd resonances can be tuned. Frequency shifts of 300 MHz have been observed with a bias voltage of 50 V for resonances at 5.6 GHz and 11.6 GHz. The tunability is independent of temperature from 4 K to 80 K. An upper bound for the loss tangent of the SrTiO/sub 3/ capacitor is extracted from the resonance Q, and tan delta <0.07 at 4 K is found.<>
  • Keywords
    barium compounds; high-temperature superconductors; microstrip components; resonators; superconducting junction devices; superconducting microwave devices; yttrium compounds; 11.6 GHz; 4 to 80 K; 5.6 GHz; 50 V; YBa/sub 2/Cu/sub 3/O/sub 7-x/-SrTiO/sub 3/; capacitance; collinear microstrip line sections; electrically tunable; ferroelectric material; high temperature superconductor; inductively-choked DC bias lines; loss tangent; odd-order coupled resonances; superconductor microstrip resonators; tunability; Capacitance; Couplings; Ferroelectric films; Ferroelectric materials; Frequency; High temperature superconductors; Microstrip resonators; Resonance; Superconducting films; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276731
  • Filename
    276731