Title :
A 0.8 dB insertion-loss, 23 dB isolation, 17.4 dBm power-handling, 5 GHz transmit/receive CMOS switch
Author :
Ohnakado, Takahiro ; Yamakawa, Satoshi ; Murakami, Takaaki ; Furukawa, Akihiko ; Nishikawa, Kazuyasu ; Taniguchi, Eiji ; Ueda, Hiroomi ; Ono, Masayoshi ; Tomisawa, Jun ; Yoneda, Yoshikazu ; Hashizume, Yasuaki ; Sugahara, Kazuyuki ; Suematsu, Noriharu ; Oo
Author_Institution :
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
Abstract :
The highest performance to date of any switch using a CMOS process, with a 0.8 dB insertion-loss, 23 dB isolation and 17.4 dBm power-handling capability at 5 GHz, is accomplished with an optimized single-pole double-throw (SPDT) transmit/receive (T/R) switch using depletion-layer-extended transistors (DETs) in a 0.18 μm CMOS process. The effects of junction capacitance decrease and substrate resistance increase in the DET, the adoption of low-loss shielded-pads, and several layout optimizations, lead to the realization of this low insertion-loss. Moreover, the combined effect of the adoption of the source/drain DC biasing scheme and the high substrate resistance in the DET contributes to the high power-handling capability.
Keywords :
CMOS integrated circuits; circuit optimisation; circuit simulation; coplanar waveguides; integrated circuit design; integrated circuit measurement; integrated circuit modelling; integrated circuit reliability; microwave switches; 0.18 micron; 0.8 dB; 5 GHz; CPW transmission lines; DET; DET high substrate resistance; SPDT; circuit reliability; circuit simulation; depletion-layer-extended transistors; junction capacitance decrease; layout optimization; low insertion-loss switches; low-loss shielded-pads; microwave transmit/receive CMOS switches; single-pole double-throw T/R switches; source/drain DC biasing schemes; substrate resistance increase; switch isolation/power-handling capability; CMOS process; CMOS technology; Capacitance; Circuit topology; Dielectrics; Radio frequency; Research and development; Switches; Switching circuits; Voltage;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE
Print_ISBN :
0-7803-7694-3
DOI :
10.1109/RFIC.2003.1213932