DocumentCode
1673685
Title
Preparation, structure and properties of Mg-based bulk amorphous and nanocrystalline nano-materials
Author
Du, Chunfeng ; Qi, Hongzhang ; Yan, Biao ; Guan, Leding
Author_Institution
Sch. of Mater. Sci. & Eng., Tongji Univ., Siping, China
fYear
2010
Firstpage
890
Lastpage
891
Abstract
The paper prepares Mg-based bulk metallic amorphous and nanocrystalline nano-materials-Mg65Cu25Y10-by acoustic frequency induction melting and rapid quenching in quartz glass tube. Making use of X-Ray diffraction (XRD), Environmental scanning electron microscopy (ESEM), Transmission electron microscopy (TEM), Atomic force microscopy (AFM), Electron probe microanalysis (EPMA) and so on, it is proved that the sample cooled by liquid nitrogen is mainly composed of amorphous matrix and a little trees dendritic as well as a little deposited nano-crystal. The glass forming ability (GFA) of Mg65Cu25Y10 system is quite large. Microcosmicly, the matrix is composed of disperse amorphous structure, while the matrix amorphous phases and the nano-crystal phases deposited among amorphous structures form a kind of special structure of ¿peritectic¿. In some areas of the sample´s surface whose cooling rate is not enough, there is visible crystallization phenomenon, forming trees dendrite structure. The composition of amorphous parts is near the composition of the mother alloy and the distribution of Mg, Cu and Y is very uniform, which is similar to the glassy state structure; while the element of Mg, Cu or Y clusters in the crystal phase to form intermetallic compound. However, the parallel Mg-Zn-Y system has low glass forming ability, in whose samples there is obviously no amorphous structure formed.
Keywords
amorphous semiconductors; atomic force microscopy; crystallisation; dendrites; electron probe analysis; magnesium compounds; melting; nanostructured materials; scanning electron microscopy; transmission electron microscopy; Mg-based bulk amorphous nanomaterials; Mg65Cu25Y10; X-ray diffraction; acoustic frequency induction melting; atomic force microscopy; cooling rate; disperse amorphous structure; electron probe microanalysis; environmental scanning electron microscopy; glass forming ability; glassy state structure; intermetallic compound; liquid nitrogen; little deposited nanocrystal; little trees dendritic; matrix amorphous phases; nanocrystal phases; nanocrystalline nanomaterials; quartz glass tube; rapid quenching; transmission electron microscopy; trees dendrite structure; visible crystallization phenomenon; Acoustic diffraction; Amorphous materials; Atomic force microscopy; Crystallization; Frequency; Glass; Scanning electron microscopy; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5425144
Filename
5425144
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