1673712

An integrated built-in self-testing and self-repair of VLSI/WSI hexagonal arrays

Mazumder, Pinaki

1995

968

Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Logic arrays; Logic testing; Production; Programmable logic arrays; Very large scale integration;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527924

527924