Title :
VLSI performance analysis method for low-voltage circuit operation
Author :
Schrom, G. ; Liu, D. ; Fischer, C. ; Pichler, C.H. ; Svensson, C.H. ; Selberherr, S.
Author_Institution :
Inst. for Microelectron., Tech. Univ. Wien, Austria
Abstract :
An efficient and accurate method for VLSI performance analysis is presented. It takes measured or simulated IV and capacitance data as input and yields the noise margins and delay parameters directly without any intermediate parameter extraction, avoiding the common errors of compact modeling. The method is applied to the IV/C data of an ultra-low-power CMOS process and the results are then verified by a rigorous device-level simulation of ring oscillators
Keywords :
CMOS integrated circuits; VLSI; capacitance; circuit analysis computing; delays; digital simulation; integrated circuit modelling; integrated circuit noise; IV data; VLSI; capacitance data; delay parameters; device-level simulation; low-voltage circuit operation; noise margins; performance analysis method; ring oscillators; ultra-low-power CMOS process; CMOS process; Capacitance measurement; Circuit noise; Circuit simulation; Delay; Noise measurement; Parameter extraction; Performance analysis; Semiconductor device modeling; Very large scale integration;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3062-5
DOI :
10.1109/ICSICT.1995.500155
