DocumentCode
1674179
Title
A fault tolerant test hardware for L1 cache module in tile CMPs architecture
Author
Saha, Mousumi ; Gautam, Navneet Kumar ; Sikdar, Biplab K.
Author_Institution
Dept. of Comput. Applic., Nat. Inst. of Technol., Durgapur, India
fYear
2015
Firstpage
1
Lastpage
6
Abstract
The present work deals with a fault tolerant approach to design the test structure for detecting the fault of cache in chip multiprocessors (CMPs). Fault detection is simplified using a 2-state 3-neighborhood null boundary cellular automata (CA). This has been elaborated in the earlier work of present authors. Self correcting property, however, has been found only in a 5-neighborhood CA and not in 3-neighborhood CA. This self-correcting or fault tolerant approach is taken as the guideline of the present work to design the fault tolerant test hardware for testing the cache in chip multiprocessors. Following this approach an 83% test accuracy has been achieved in the test hardware.
Keywords
cache storage; cellular automata; fault tolerant computing; microprocessor chips; multiprocessing systems; 2-state 3-neighborhood null boundary cellular automata; CA; L1 cache module; chip multiprocessors; fault detection; fault tolerant approach; fault tolerant test hardware; self-correcting approach; tile CMP architecture; Circuit faults; Computer architecture; Fault tolerance; Fault tolerant systems; Hardware; Microprocessors; Testing; CMPs; March test; cache testing; cellular automata;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location
Ahmedabad
Print_ISBN
978-1-4799-1742-6
Type
conf
DOI
10.1109/ISVDAT.2015.7208100
Filename
7208100
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