• DocumentCode
    1674263
  • Title

    Applications of the IEEE P1149.5 module test and maintenance bus

  • Author

    Landis, Dave ; Hudson, Chuck ; McHugh, Pat

  • fYear
    1995
  • Firstpage
    984
  • Keywords
    Backplanes; Circuit testing; Electronic equipment testing; Fault tolerance; IEEE standards; Maintenance; Master-slave; Protocols; Standards development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527926
  • Filename
    527926
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1674263