1674263

Applications of the IEEE P1149.5 module test and maintenance bus

Landis, Dave ; Hudson, Chuck ; McHugh, Pat

1995

984

Backplanes; Circuit testing; Electronic equipment testing; Fault tolerance; IEEE standards; Maintenance; Master-slave; Protocols; Standards development; System testing;

English

ieee

Test Conference, 1992. Proceedings., International

Baltimore, MD

1089-3539

0-7803-0760-7

conf

10.1109/TEST.1992.527926

527926