Title :
Verification of dc-performance for d/a converters using behavioral modeling
Author :
Anheier, W. ; Bochnick, H.
Author_Institution :
Inst. for Microelectron., Bremen Univ., Germany
Abstract :
As the level of system integration increases new methods for tolerance analyses are necessary to allow system-level verification. In order to determine DC system performances, so far circuit level simulation of the entire system is performed which turned out to be too expensive. Therefore, a new method is proposed, based on behavioral modeling of analog/digital circuits
Keywords :
digital-analogue conversion; tolerance analysis; D/A converter; DC performance; analog/digital circuit; behavioral modeling; system-level verification; tolerance analysis; Analog-digital conversion; Circuit simulation; Covariance matrix; Digital circuits; Gaussian distribution; Matrix converters; Microelectronics; Minimization methods; Taylor series; Tolerance analysis;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 1995 4th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-3062-5
DOI :
10.1109/ICSICT.1995.500161
