DocumentCode
1674521
Title
Reliability evaluation of voltage controlled oscillators based on a device degradation sub-circuit model
Author
Lin, Wei-Cheng ; Du, Long-Jei ; King, Ya-Chin
Author_Institution
Dept. of Electr. Eng., Nat. Tsing-Hua Univ., Hsin-Chu, Taiwan
fYear
2003
Firstpage
377
Lastpage
380
Abstract
This paper presents a method for circuit reliability evaluation. Based on the study of device reliability, a sub-circuit describing the device degradation after high-voltage stress is proposed. This model allows circuit reliability of VCOs to be evaluated and provides higher degree of freedom for circuit designers.
Keywords
circuit reliability; voltage-controlled oscillators; circuit reliability; device degradation; device reliability; high-voltage stress; sub-circuit model; voltage controlled oscillator; CMOS technology; Circuit simulation; Degradation; Frequency; Integrated circuit measurements; Leakage current; Semiconductor device modeling; Stress measurement; Voltage; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE
ISSN
1529-2517
Print_ISBN
0-7803-7694-3
Type
conf
DOI
10.1109/RFIC.2003.1213966
Filename
1213966
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