DocumentCode
1674571
Title
TSV aware standard cell placement for 3D ICs
Author
Pawanekar, Sameer ; Trivedi, Gaurav
Author_Institution
Dept. of Electron. & Electr. Eng., Indian Inst. of Technol., Guwahati, Guwahati, India
fYear
2015
Firstpage
1
Lastpage
6
Abstract
Advantage of 3D ICs is that it has reduced wire-length and greater performance compared to conventional 2D ICs. It is important that a 3D placement tool obtains improved wirelength over 2D placement. In this paper we present the implementation of our 3D placement tool. Our work is based on analytical framework, where we solve nonlinear equations. Placement problem is modeled as quadratic penalty for the density of cells in three dimensions. At first we perform quadratic optimization to obtain an initial placement, followed by solving the objective function using conjugate gradient method. The wire-length obtained by our 3D placement tools show an improvement of 16.4% over the placement tools F3D. In another experiment, where the number of TSVs are determined by initial k-way partitioning of the input netlist, we obtain 52% improvement over F3D, in terms of number of TSVs.
Keywords
conjugate gradient methods; integrated circuit layout; optimisation; three-dimensional integrated circuits; 3D integrated circuit; 3D placement tool; TSV aware standard cell placement; conjugate gradient method; nonlinear equations; objective function; quadratic penalty; wire length reduction; Design automation; Mathematical model; Optimization; Standards; Three-dimensional displays; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design and Test (VDAT), 2015 19th International Symposium on
Conference_Location
Ahmedabad
Print_ISBN
978-1-4799-1742-6
Type
conf
DOI
10.1109/ISVDAT.2015.7208113
Filename
7208113
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