DocumentCode :
1674607
Title :
Effect of Skull Inhomogeneities on Localization Accuracy in Brain Electrical Impedance Tomography
Author :
Ni Ansheng ; Tang Chi ; Yang Guosheng ; Fu Feng ; Dong Xiuzhen
Author_Institution :
Dept. of Biomed. Eng., Fourth Mil. Med. Univ., Xi´an
fYear :
2008
Firstpage :
2705
Lastpage :
2707
Abstract :
The structural similarity of the head model affects the accuracy of solutions to electrical impedance tomography (EIT) forward problem. The conductivity of skull is one of the most sensitive head model parameters. Generally, the skull is considered as a homogeneous whole, while in fact it is inhomogeneous. In this paper EIT images are reconstructed with different head models to detect and localize the conductivity changes in brain. The simulation results show that localization accuracy of the conductivity changes in brain has been improved when skull inhomogeneities are taken into account. Incorporation of skull inhomogeneities into image reconstruction is an effective way to improve image quality of brain EIT.
Keywords :
bioelectric phenomena; brain; electric impedance imaging; electrical conductivity; image reconstruction; medical image processing; neurophysiology; physiological models; EIT; brain conductivity; brain electrical impedance tomography; head model; image quality; image reconstruction; localization accuracy; skull conductivity; skull inhomogeneities effect; structural similarity; Biomedical imaging; Brain modeling; Conductivity; Head; Image reconstruction; Impedance; Skull; Tomography; Virtual manufacturing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioinformatics and Biomedical Engineering, 2008. ICBBE 2008. The 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-1747-6
Electronic_ISBN :
978-1-4244-1748-3
Type :
conf
DOI :
10.1109/ICBBE.2008.1008
Filename :
4535888
Link To Document :
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