DocumentCode
1674819
Title
IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS
Author
Bruce, W.C. ; Gallup, Michael G. ; Giles, Grady ; Munns, Tom
fYear
1992
Firstpage
999
Keywords
CMOS technology; Design for testability; Microprocessors; Pins; Production facilities; Reduced instruction set computing; Semiconductor devices; Statistics; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527928
Filename
527928
Link To Document