Title :
IMPLEMENTING 1149.1 ON CMOS MICROPROCESSORS
Author :
Bruce, W.C. ; Gallup, Michael G. ; Giles, Grady ; Munns, Tom
Keywords :
CMOS technology; Design for testability; Microprocessors; Pins; Production facilities; Reduced instruction set computing; Semiconductor devices; Statistics; Testing; Very large scale integration;
Conference_Titel :
Test Conference, 1992. Proceedings., International
Print_ISBN :
0-7803-0760-7
DOI :
10.1109/TEST.1992.527928
