Title :
Time resolved X-ray studies in semiconductor nanostructures
Author :
Jurgilaitis, A. ; Harb, M. ; Enquist, H. ; Nüske, R. ; Persson, A. ; Larsson, J.
Author_Institution :
Dept. of Phys., Lund Univ., Lund, Sweden
Abstract :
Time resolved X-ray diffraction has been used to study acoustic oscillations in InAs/Sb nanowires with diameters of 80 nm and 40 nm in order to determine the speed of sound in the wires.
Keywords :
X-ray diffraction; acoustic wave velocity; antimony; indium compounds; nanowires; oscillations; semiconductor quantum wires; InAs-Sb; acoustic oscillation; nanowires; semiconductor nanostructure; size 40 nm; size 80 nm; sound speed; time resolved X-ray diffraction; Crystals; Frequency measurement; Nanowires; Phonons; Strain; Vectors; X-ray diffraction;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
