Title :
A high isolation CMFB downconversion micromixer using 0.18-μm deep n-well CMOS technology
Author :
Meng, C.C. ; Xu, S.K. ; Wu, T.H. ; Chao, M.H. ; Huang, G.W.
Author_Institution :
Dept. of Commun. Eng., Nat. Chiao-Tung Univ., Hsin-Chu, Taiwan
Abstract :
CMOS deep n-well technology can eliminate body effects of NMOS transistors and improve LO-IF and LO-RF isolation in a Gilbert micromixer. A 37 dB LO-IF and 38 dB LO-RF isolation downconversion micromixer with 19 dB conversion gain, IP1dB=-19.5 dBm and IIP3=-12.5 dBm when RF=2.4 GHz and LO=2.25 GHz is demonstrated in this paper by using 0.18 μm deep n-well CMOS technology. The input return loss and output return loss are better than 15 dB for frequencies up to 6 GHz. On the other hand, a downconversion micromixer without deep n-well has almost identical power performance but achieves only 20 dB LO-IF isolation and 21 dB LO-RF isolation even if two kinds of mixers are fabricated in adjacent areas of the same wafer. The downconversion micromixer used here has an intrinsically single-to-differential input stage and active differential PMOS loads to increase IF differential gain while CMFB is used to stabilize bias points. An IF differential amplifier converts differential output into a single-ended output. Finally, an off-chip rat-race coupler provides balanced LO signals to facilitate isolation measurement.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF mixers; circuit feedback; losses; 0.18 micron; 19 dB; 2.25 GHz; 2.4 GHz; 6 GHz; CMFB downconversion micromixer; Gilbert micromixer; IF differential amplifier; LO-IF isolation; LO-RF isolation; active differential PMOS loads; bias points stabilization; common mode feedback; deep n-well CMOS technology; high isolation micromixer; input return loss; output return loss; single-to-differential input stage; CMOS technology; Chaotic communication; Degradation; Frequency; Gain; Isolation technology; Laboratories; MOSFETs; Mixers; Transconductance;
Conference_Titel :
Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE
Print_ISBN :
0-7803-7694-3
DOI :
10.1109/RFIC.2003.1214023