• DocumentCode
    1676349
  • Title

    Dependence of return voltage characteristics on change of insulation conductivity and polarization resistance

  • Author

    Kozlovskis, Aldis

  • Author_Institution
    Inst. of Power Eng., Riga Tech. Univ., Latvia
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    A demand for a reliable diagnostic method is growing by the increase of the age of equipment. The return voltage characteristics such as the maximum of return voltage, the initial slope of return voltage and the time to peak value dependencies on charging time are discussed in this paper. The analysis of these characteristics increases the information of the insulation properties of equipment. The increase of conductivity and decrease of polarization resistance are closely related with the ageing processes of insulation. The changes of these dielectric phenomena can be seen by the analysis of return voltage characteristics. The theoretical study of the polarization index particularly used for the assessment of insulation systems is given in paper
  • Keywords
    ageing; electrical conductivity; insulation testing; polarisation; power apparatus; voltage measurement; HV equipment insulation; ageing processes; charging time; diagnostic method; dielectric phenomena; equipment insulation properties; insulation conductivity; polarization index; polarization resistance; return voltage characteristics; return voltage measurements; Conductivity; Dielectric loss measurement; Dielectric measurements; Dielectrics and electrical insulation; Electrical resistance measurement; Equivalent circuits; Loss measurement; Polarization; Power transformer insulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1999. Proceedings
  • Conference_Location
    Cincinnati, OH
  • ISSN
    0362-2479
  • Print_ISBN
    0-7803-5757-4
  • Type

    conf

  • DOI
    10.1109/EEIC.1999.826189
  • Filename
    826189