Title :
Characterization and optimization of electrooptic sampling by volume-integral-method and application of space-harmonic potential
Author :
Rottenkolber, M. ; Thomann, W. ; Russer, P.
Author_Institution :
Lehrstuhl fur Hochfrequenztechnik, Tech. Univ. Munchen, Germany
Abstract :
A method for the calculation of sensitivity and spatial resolution in electrooptic (EO) sampling is described. The method can be applied to an external EO probing tip and to direct probing in EO active substrates. The change in polarization and the resulting intensity variations of the reflected sampling beam after passing through a polarizer are determined using the volume-integral method, which yields a rigorous treatment of the influence of the electrical field and the optical beam. In the case of an external EO probe tip a layered structure with a space-harmonic potential is investigated in detail, and results on sensitivity and spatial resolution are presented.<>
Keywords :
electro-optical devices; integral equations; light polarisation; probes; sensitivity analysis; direct probing; electrical field; electro-optic active substrates; electrooptic sampling; external EO probing tip; optical beam; optimization; polarization; reflected sampling beam; sensitivity; space-harmonic potential; spatial resolution; volume-integral-method; Integrated optics; Microwave measurements; Optical beams; Optical polarization; Optical sensors; Planar transmission lines; Power transmission lines; Probes; Sampling methods; Spatial resolution;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.276827
