Title :
A 70-GHz Effective Sampling Rate On-Chip Oscilloscope with Time-Domain Digitization
Author :
Safi-Harb, Mona ; Roberts, Gordon W.
Author_Institution :
Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que.
Abstract :
An on-chip digitizer for the transient measurement of digital signal integrity is proposed. Undersampling, combined with single-path time-domain processing is used to perform the embedded measurement in a time-efficient manner. On-chip interconnect crosstalk generation with variable strength is included on chip for characterization, and successfully measured using a prototype chip, implemented in a 0.18 mum CMOS process. The proposed system is easily calibratable, with an estimated static power dissipation of ~3.5 mW. The total active area taken up by the associated test and calibration vehicles is 0.45 mm2
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; oscilloscopes; time-domain analysis; 0.18 micron; 70 GHz; CMOS process; digital signal integrity; embedded measurement; on-chip digitizer; on-chip interconnect crosstalk generation; on-chip oscilloscope; single-path time-domain processing; time domain digitization; transient measurement; Character generation; Crosstalk; Oscilloscopes; Performance evaluation; Power system interconnection; Prototypes; Sampling methods; Semiconductor device measurement; Signal sampling; Time domain analysis;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320964
