• DocumentCode
    1677295
  • Title

    ITO, Si3N4 and ZnO:Al -- Simulation of Different Anti-reflection Coatings (ARC) for Thin Film a-Si:H Solar Cells

  • Author

    Islam, Kaidul ; Alnuaimi, Aaesha ; Ally, H. ; Nayfeh, Ammar

  • Author_Institution
    Microsyst. Eng., Masdar Inst. of Sci. & Technol., Abu Dhabi, United Arab Emirates
  • fYear
    2013
  • Firstpage
    673
  • Lastpage
    676
  • Abstract
    For thin film solar cells incorporating amorphous silicon (a-Si:H) as absorber materials, minimizing reflection from the top surface i.e. maximizing transmittance of the incoming light into the absorber for higher absorption plays an important role for the overall device performance. This paper discusses ways to minimize reflection using different anti-reflection coatings (ARC) at the top surface of the solar cell. Focus of this paper is to study the effect of ITO, Si3N4 and ZnO:Al as ARC on thin film aSi:H n-i-p solar cells. The influences of electrical and optical properties of the said materials are modeled using Sentaurus TCAD. Results suggest that 60 nm Si3N4 proves to be the best ARC among the studied three and a very thin layer of ZnO:Al e.g. 20 nm can also be effective.
  • Keywords
    II-VI semiconductors; absorption; aluminium; amorphous semiconductors; antireflection coatings; elemental semiconductors; hydrogen; indium compounds; optical properties; semiconductor thin films; silicon; silicon compounds; solar cells; tin compounds; wide band gap semiconductors; zinc compounds; ARC; ITO; Sentaurus TCAD; Si:H; Si3N4; ZnO:Al; absorber materials; amorphous silicon; antireflection coatings; electrical properties; optical properties; size 20 nm; size 60 nm; thin film n-i-p solar cells; transmittance maximization; Coatings; Films; Indium tin oxide; Photovoltaic cells; Refractive index; Silicon; ARC; ITO; Si3N4; Solar cell; TCO; ZnO:Al;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Modelling Symposium (EMS), 2013 European
  • Conference_Location
    Manchester
  • Print_ISBN
    978-1-4799-2577-3
  • Type

    conf

  • DOI
    10.1109/EMS.2013.112
  • Filename
    6779924