Title :
Verification of Complex Analog Integrated Circuits
Author :
Kundert, Ken ; Chang, Henry
Author_Institution :
Designer´´s Guide Consulting, Inc., Sunnyvale, CA
Abstract :
Functional complexity in analog, mixed-signal, and RF (A/RF) designs is increasing dramatically. Today´s simple A/RF functional block such as an RF receiver or power management unit can have hundreds to thousands of control bits. A/RF designs implement many modes of operation for different standards, power saving modes, and calibration. Increasingly, catastrophic failures in chips are due to functional bugs, and not due to missed performance specifications. Functionally verifying A/RF designs is a daunting task requiring a rigorous and systematic verification methodology. As occurred in digital design, analog verification is becoming a critical task that is distinct from design. This paper describes a verification methodology to address these challenges
Keywords :
analogue integrated circuits; formal verification; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; RF designs; analog integrated circuits verification; functional complexity; mixed-signal design; verification methodology; Analog integrated circuits; Calibration; Computer bugs; Design engineering; Energy management; Explosions; Phase locked loops; Pins; Radio frequency; Sampled data circuits;
Conference_Titel :
Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
1-4244-0075-9
Electronic_ISBN :
1-4244-0076-7
DOI :
10.1109/CICC.2006.320883